<?xml version="1.0" encoding="utf-8" standalone="yes"?>
<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom" xmlns:content="http://purl.org/rss/1.0/modules/content/">
  <channel>
    <title>Parameter on Test Science Research Document Library</title>
    <link>https://research.testscience.org/keywords/parameter/</link>
    <description>Recent content in Parameter on Test Science Research Document Library</description>
    <generator>Hugo -- 0.129.0</generator>
    <language>en-us</language>
    <copyright>Institute for Defense Analyses</copyright>
    <lastBuildDate>Mon, 01 Jan 2018 00:00:00 +0000</lastBuildDate>
    <atom:link href="https://research.testscience.org/keywords/parameter/index.xml" rel="self" type="application/rss+xml" />
    <item>
      <title>Parametric Reliability Models Tutorial</title>
      <link>https://research.testscience.org/post/2018-parametric-reliability-models-tutorial/</link>
      <pubDate>Mon, 01 Jan 2018 00:00:00 +0000</pubDate>
      <guid>https://research.testscience.org/post/2018-parametric-reliability-models-tutorial/</guid>
      <description>This tutorial demonstrates how to plot reliability functions parametrically in R using the output from any reliability modeling software. It provides code and sample plots of reliability and failure rate functions with confidence intervals for three different skewed probability distributions the exponential, the two-parameter Weibull, and the lognormal. These three distributions are the most common parametric models for reliability or survival analysis. This paper also provides mathematical background for the models and recommendations for when to use them.</description>
      <content:encoded><![CDATA[<p>This tutorial demonstrates how to plot reliability functions parametrically in R using the output from any reliability modeling software. It provides code and sample plots of reliability and failure rate functions with confidence intervals for three different skewed probability distributions  the exponential, the two-parameter Weibull, and the lognormal. These three distributions are the most common parametric models for reliability or survival analysis. This paper also provides mathematical background for the models and recommendations for when to use them.</p>
<h4 id="suggested-citation">Suggested Citation</h4>
<blockquote>
<p>Pinelis, Yevgeniya K, and William R Whitledge. “Tutorial: Parametric Reliability Models.” Institute for Defense Analyses IDA Non-Standard Document NS D-9171 (September 2018).</p>
</blockquote>
<h4 id="paper">Paper:</h4>
<embed src= "paper.pdf" width= "100%" height= "700px" type="application/pdf" >

]]></content:encoded>
    </item>
  </channel>
</rss>
